Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis

Basics of Imaging and Analysis

Nobuo Tanaka

• Verlag: ICP
• Jahr: 2014
• ISBN:
  9781783264711
• Thema: Biological Sciences
• Thema: Science General

The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials. Contents:

• • Introduction (N Tanaka)
  • Historical Survey of the Development of STEM Instruments (N Tanaka)
• Basic Knowledge of STEM:
  • Basics of STEM (N Tanaka and K Saitoh)
  • Application of STEM to Nanomaterials and Biological Specimens (N Shibata, S D Findlay, Y Ikuhara and N Tanaka)
• Theories of STEM Imaging:
  • Theory for HAADF-STEM and Its Image Simulation (K Watanabe)
  • Theory for Annular Bright Field STEM Imaging (S D Findlay, N Shibata and Y Ikuhara)
  • Electron Energy-Loss Spectroscopy in STEM and Its Imaging (K Kimoto)
  • Density Functional Theory for ELNES in STEM-EELS (T Mizoguchi)
• Advanced Methods in STEM:
  • Aberration Correction in STEM (H Sawada)
  • Secondary Electron Microscopy in STEM (H Inada and Y Zhu)
  • Scanning Confocal Electron Microscopy (K Mitsuishi and M Takeguchi)
  • Electron Tomography in STEM (N Tanaka)
  • Electron Holography and Lorentz Electron Microscopy in STEM (N Tanaka)
  • Recent Topics and Future Prospects in STEM (N Tanaka)
  
  Readership: Graduate students and researchers in the field of nanomaterials and nanostructures.
• Key Features:
  • Most advanced; befitting beginning graduate students
  • Very convenient for advanced researchers who would like to use STEM and have a comprehensive understanding of the theory of image contrast and application details
  • Spans from the basic theory to the applications of STEM

Inhaltsverzeichnis

• Cover Page
• Title Page
• Copyright Page
• Table of Contents
• Preface
• Acknowledgments
• List of Contributors
• List of Abbreviations
• List of Symbols
• For Students and Beginners
• Softwares for Simulation
• Table of Values of Related Physical Constants
• Table of Electron Wavelength
• 1. Introduction N. Tanaka
• 2. Historical Survey of the Development of STEM Instruments N. Tanaka
• Part 1: Basic Knowledge of Stem
• Part 2: Theories of STEM Imaging
• Part 3: Advanced Methods in STEM
• Appendices
• Author Index
• Subject Index