Secondary Ion Mass Spectrometry
An Introduction to Principles and Practices
- English
- ePUB (mobile friendly)
- Available on iOS & Android
About This Book
Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS)
â˘Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations
â˘Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission
â˘Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS)
â˘Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions
â˘Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other
Frequently asked questions
Information
Table of contents
- Cover
- Title Page
- Copyright
- Foreword
- Preface
- Acknowledgments
- List of Constants
- Chapter 1: Introduction
- Section I: Principles
- Section II: Practices
- Appendix A
- Technique Acronym List
- Abbreviations Commonly used in SIMS
- Glossary of Terms
- Questions and Answers
- References
- Index
- End User License Agreement