- English
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eBook - ePub
About this book
A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by the world's leading experts in the field, it fills the gap in the current literature by bridging the fields of optical imaging and metrology, and is the only up-to-date resource in terms of fundamental knowledge, basic concepts, methodologies, applications, and development trends.
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Table of contents
- Cover
- Related Titles
- Title Page
- Copyright
- Preface
- List of Contributors
- Chapter 1: LCOS Spatial Light Modulators: Trends and Applications
- Chapter 2: Three-Dimensional Display and Imaging: Status and Prospects
- Chapter 3: Holographic Television: Status and Future
- Chapter 4: Display Holography – Status and Future
- Chapter 5: Incoherent Computer-Generated Holography for 3D Color Imaging and Display
- Chapter 6: Approaches to Overcome the Resolution Problem in Incoherent Digital Holography
- Chapter 7: Managing Digital Holograms and the Numerical Reconstruction Process for Focus Flexibility
- Chapter 8: Three-Dimensional Particle Control by Holographic Optical Tweezers
- Chapter 9: The Role of Intellectual Property Protection in Creating Business in Optical Metrology
- Chapter 10: On the Difference between 3D Imaging and 3D Metrology for Computed Tomography
- Chapter 11: Coherence Holography: Principle and Applications
- Chapter 12: Quantitative Optical Microscopy at the Nanoscale:New Developments and Comparisons
- Chapter 13: Model-Based Optical Metrology
- Chapter 14: Advanced MEMS Inspection by Direct and Indirect Solution Strategies
- Chapter 15: Different Ways to Overcome the Resolution Problem in Optical Micro and Nano Metrology
- Chapter 16: Interferometry in Harsh Environments
- Chapter 17: Advanced Methods for Optical Nondestructive Testing
- Chapter 18: Upgrading Holographic Interferometry for Industrial Application by Digital Holography
- Index
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Yes, you can access Optical Imaging and Metrology by Wolfgang Osten,Nadya Reingand in PDF and/or ePUB format, as well as other popular books in Physical Sciences & Optics & Light. We have over one million books available in our catalogue for you to explore.