eBook - PDF
Ion Beam Analysis
Fundamentals and Applications
This is a test
- 472 pages
- English
- PDF
- Available on iOS & Android
eBook - PDF
Book details
Table of contents
Citations
About This Book
Ion Beam Analysis: Fundamentals and Applications explains the basic characteristics of ion beams as applied to the analysis of materials, as well as ion beam analysis (IBA) of art/archaeological objects. It focuses on the fundamentals and applications of ion beam methods of materials characterization.The book explains how ions interact with solids
Frequently asked questions
At the moment all of our mobile-responsive ePub books are available to download via the app. Most of our PDFs are also available to download and we're working on making the final remaining ones downloadable now. Learn more here.
Both plans give you full access to the library and all of Perlego’s features. The only differences are the price and subscription period: With the annual plan you’ll save around 30% compared to 12 months on the monthly plan.
We are an online textbook subscription service, where you can get access to an entire online library for less than the price of a single book per month. With over 1 million books across 1000+ topics, we’ve got you covered! Learn more here.
Look out for the read-aloud symbol on your next book to see if you can listen to it. The read-aloud tool reads text aloud for you, highlighting the text as it is being read. You can pause it, speed it up and slow it down. Learn more here.
Yes, you can access Ion Beam Analysis by Michael Nastasi, James W. Mayer, Yongqiang Wang in PDF and/or ePUB format, as well as other popular books in Sciences physiques & Physique nucléaire. We have over one million books available in our catalogue for you to explore.
Information
Table of contents
- Front Cover
- Brief Contents
- Contents
- Preface
- About the Authors
- Contributors
- Chapter 1: Overview
- Chapter 2: Kinematics
- Chapter 3: Cross Section
- Chapter 4: Ion Stopping
- Chapter 5: Backscattering Spectrometry
- Chapter 6: Elastic Recoil Detection Analysis
- Chapter 7: Nuclear Reaction Analysis
- Chapter 8: Particle-Induced X-Ray Emission Analysis
- Chapter 9: Ion Channeling
- Chapter 10: Thin Film Depth Profiling
- Chapter 11: Defects Measurements of a Crystalline Solid
- Chapter 12: Nuclear Energy Research Applications
- Chapter 13: Art and Archaeology Applications
- Chapter 14: Biomedical Applications
- Chapter 15: IBA Software
- Appendix A: Crystallography
- Appendix B: Rutherford Backscattering Spectrometry (RBS) Kinematic Factors
- Appendix C: Rutherford Cross Sections for 1 MeV 1H and 4He Ion Beams
- Appendix D: Proton-Induced Gamma Emissions from Light Elements (3 ≤ Z ≤ 26)
- Appendix E: Characteristic X-Ray Energies and Relative Intensities
- Appendix F: Useful Schematic Illustrations in Ion Channeling Analysis
- Appendix G: Data Analysis Software for Ion Beam Analysis
- Appendix H: Physical Constants, Combinations, and Conversions
- Back Cover