Handbook of Charged Particle Optics
eBook - ePub

Handbook of Charged Particle Optics

Jon Orloff

  1. 666 pages
  2. English
  3. ePUB (mobile friendly)
  4. Available on iOS & Android
eBook - ePub

Handbook of Charged Particle Optics

Jon Orloff

Book details
Table of contents
Citations

About This Book

With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments.

The book's unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field's cutting-edge technologies with added insight into how they work.

Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentation.

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Information

Publisher
CRC Press
Year
2017
ISBN
9781351835770
Edition
2
Topic
Physical Sciences
Subtopic
Optics & Light

Table of contents

  1. Cover Page
  2. Half title
  3. Title Page
  4. Copyright Page
  5. Table of Contents
  6. Preface to the Second Edition
  7. Editor
  8. Contributors
  9. 1 Review of ZrO/W Schottky Cathode
  10. 2 Liquid Metal Ion Sources
  11. 3 Gas Field Ionization Sources
  12. 4 Magnetic Lenses for Electron Microscopy
  13. 5 Electrostatic Lenses
  14. 6 Aberrations
  15. 7 Space Charge and Statistical Coulomb Effects
  16. 8 Resolution
  17. 9 The Scanning Electron Microscope*
  18. 10 The Scanning Transmission Electron Microscope
  19. 11 Focused Ion Beams
  20. 12 Aberration Correction in Electron Microscopy
  21. Appendix: Computational Resources for Electron Microscopy
  22. Index