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Handbook of Charged Particle Optics
Jon Orloff
- 666 pages
- English
- ePUB (mobile friendly)
- Available on iOS & Android
Handbook of Charged Particle Optics
Jon Orloff
About This Book
With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments.
The book's unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field's cutting-edge technologies with added insight into how they work.
Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentation.
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Table of contents
- Cover Page
- Half title
- Title Page
- Copyright Page
- Table of Contents
- Preface to the Second Edition
- Editor
- Contributors
- 1 Review of ZrO/W Schottky Cathode
- 2 Liquid Metal Ion Sources
- 3 Gas Field Ionization Sources
- 4 Magnetic Lenses for Electron Microscopy
- 5 Electrostatic Lenses
- 6 Aberrations
- 7 Space Charge and Statistical Coulomb Effects
- 8 Resolution
- 9 The Scanning Electron Microscope*
- 10 The Scanning Transmission Electron Microscope
- 11 Focused Ion Beams
- 12 Aberration Correction in Electron Microscopy
- Appendix: Computational Resources for Electron Microscopy
- Index