eBook - PDF
FinFET Modeling for IC Simulation and Design
Using the BSIM-CMG Standard
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- 304 pages
- English
- PDF
- Available on iOS & Android
eBook - PDF
FinFET Modeling for IC Simulation and Design
Using the BSIM-CMG Standard
Book details
Table of contents
Citations
About This Book
This book is the first to explain FinFET modeling for IC simulation and the industry standard â BSIM-CMG - describing the rush in demand for advancing the technology from planar to 3D architecture, as now enabled by the approved industry standard.
The book gives a strong foundation on the physics and operation of FinFET, details aspects of the BSIM-CMG model such as surface potential, charge and current calculations, and includes a dedicated chapter on parameter extraction procedures, providing a step-by-step approach for the efficient extraction of model parameters.
With this book you will learn:
- Why you should use FinFET
- The physics and operation of FinFET
- Details of the FinFET standard model (BSIM-CMG)
- Parameter extraction in BSIM-CMG
- FinFET circuit design and simulation
- Authored by the lead inventor and developer of FinFET, and developers of the BSIM-CM standard model, providing an experts' insight into the specifications of the standard
- The first book on the industry-standard FinFET model - BSIM-CMG
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Yes, you can access FinFET Modeling for IC Simulation and Design by Yogesh Singh Chauhan,Darsen Lu,Sriramkumar Vanugopalan,Sourabh Khandelwal,Juan Pablo Duarte,Navid Payvadosi,Ali Niknejad,Chenming Hu in PDF and/or ePUB format, as well as other popular books in Technology & Engineering & Electrical Engineering & Telecommunications. We have over one million books available in our catalogue for you to explore.
Information
Table of contents
- Front Cover
- FinFET Modeling for IC Simulation and Design: Using the BSIM-CMG Standard
- Copyright
- Contents
- Preface
- Author Biographies
- Chapter 1: FinFETâFrom device concept to standard compact model
- Chapter 2: Compact models for analog and RF applications
- Chapter 3: Core model for FinFETs
- Chapter 4: Channel current and real device effects
- Chapter 5: Leakage currents
- Chapter 6: Charge, capacitance, and non-quasi-static effects
- Chapter 7: Parasitic resistances and capacitances
- Chapter 8: Noise
- Chapter 9: Junction diode I-V and C-V models
- Chapter 10: Benchmark tests for compact models
- Chapter 11: BSIM-CMG model parameter extraction
- Chapter 12: Temperature dependence
- Appendix: Parameter List
- Index