X-Ray Optics and Microanalysis 1992, Proceedings of the 13th INT Conference, 31 August-4 September 1992, Manchester, UK
- 680 pages
- English
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X-Ray Optics and Microanalysis 1992, Proceedings of the 13th INT Conference, 31 August-4 September 1992, Manchester, UK
About This Book
The first ICXOM congress held in Cambridge was the brain-child of Dr. Ellis Cosslett, founder of the Electron Optics Section of the Cavendish Laboratory. Dr. Cosslett pioneered research in x-ray optics and microanalysis and retained a close interest in all subject applications for this area of research, including physics, materials science, chemistry, and biology. X-Ray Optics and Microanalysis 1992 was held in his memory. At a special symposium, friends and colleagues reviewed the present status of research in x-ray optics and microanalysis. S.J. Pennycook of Oak Ridge National Laboratory, D.B. Williams of Lehigh University, J.A. Venables et al. of Arizona State University and Sussex University, and C. Jacobsen et al. of SUNY, Stony Brook are among the researchers whose papers are included in this volume.
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Table of contents
- Cover
- Half Title
- Series Page
- Title Page
- Copyright Page
- Preface
- Acknowledgments
- Dedication
- Contents
- Chapter 1: Cosslett Symposium
- Chapter 2: Electron Probe Microanalysis, EPMA
- Chapter 3: Analytical Electron Microscopy, AEM
- Chapter 4: Complementary Microscopy, STM, AFM
- Chapter 5: Image Processing
- Chapter 6: Surface Analysis and Imaging, AES, XPS, SIMS, PEM
- Chapter 7: X-Ray Sources, Optics and Imaging
- Chapter 8: Synchrotron Radiation Sources and their Applications
- Chapter 9: Highlights of Congress
- Author Index
- Subject Index