X-Ray Optics and Microanalysis 1992, Proceedings of the 13th INT  Conference, 31 August-4 September 1992, Manchester, UK
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X-Ray Optics and Microanalysis 1992, Proceedings of the 13th INT Conference, 31 August-4 September 1992, Manchester, UK

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eBook - ePub

X-Ray Optics and Microanalysis 1992, Proceedings of the 13th INT Conference, 31 August-4 September 1992, Manchester, UK

Book details
Table of contents
Citations

About This Book

The first ICXOM congress held in Cambridge was the brain-child of Dr. Ellis Cosslett, founder of the Electron Optics Section of the Cavendish Laboratory. Dr. Cosslett pioneered research in x-ray optics and microanalysis and retained a close interest in all subject applications for this area of research, including physics, materials science, chemistry, and biology. X-Ray Optics and Microanalysis 1992 was held in his memory. At a special symposium, friends and colleagues reviewed the present status of research in x-ray optics and microanalysis. S.J. Pennycook of Oak Ridge National Laboratory, D.B. Williams of Lehigh University, J.A. Venables et al. of Arizona State University and Sussex University, and C. Jacobsen et al. of SUNY, Stony Brook are among the researchers whose papers are included in this volume.

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Yes, you can access X-Ray Optics and Microanalysis 1992, Proceedings of the 13th INT Conference, 31 August-4 September 1992, Manchester, UK by P.B. Kenway,P.J. Duke in PDF and/or ePUB format, as well as other popular books in Physical Sciences & Physics. We have over one million books available in our catalogue for you to explore.

Information

Publisher
CRC Press
Year
2020
ISBN
9781000157086
Edition
1

Table of contents

  1. Cover
  2. Half Title
  3. Series Page
  4. Title Page
  5. Copyright Page
  6. Preface
  7. Acknowledgments
  8. Dedication
  9. Contents
  10. Chapter 1: Cosslett Symposium
  11. Chapter 2: Electron Probe Microanalysis, EPMA
  12. Chapter 3: Analytical Electron Microscopy, AEM
  13. Chapter 4: Complementary Microscopy, STM, AFM
  14. Chapter 5: Image Processing
  15. Chapter 6: Surface Analysis and Imaging, AES, XPS, SIMS, PEM
  16. Chapter 7: X-Ray Sources, Optics and Imaging
  17. Chapter 8: Synchrotron Radiation Sources and their Applications
  18. Chapter 9: Highlights of Congress
  19. Author Index
  20. Subject Index