An Introduction to Logic Circuit Testing

Parag K. Lala

• Publisher: Springer
• Year: 2022
• ISBN:
  9783031797859
• Topic: Technik & Maschinenbau
• Subtopic: Maschinenbau Allgemein

An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips.Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References

Table of contents

• Cover
• Copyright Page
• Title Page
• Dedication
• Preface
• Contents
• Chapter 1 Introduction
• Chapter 2 Fault Detection in Logic Circuits
• Chapter 3 Design for Testability
• Chapter 4 Built-in Self-Test
• Author Biography