In Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis and Applications, a team of eminent researchers delivers an incisive exploration of how the traditional experimental technique of spectroscopic ellipsometry is used to characterize the intrinsic properties of novel materials. The book focuses on the scientifically and technologically important two-dimensional transition metal dichalcogenides (2D-TMDs), magnetic oxides like manganite materials, and unconventional superconductors, including copper oxide systems.

The distinguished authors discuss the characterization of properties, like electronic structures, interfacial properties, and the consequent quasiparticle dynamics in novel quantum materials. Along with illustrative and specific case studies on how spectroscopic ellipsometry is used to study the optical and quasiparticle properties of novel systems, the book includes:

Thorough introductions to the basic principles of spectroscopic ellipsometry and strongly correlated systems, including copper oxides and manganites
Comprehensive explorations of two-dimensional transition metal dichalcogenides
Practical discussions of single layer graphene systems and nickelate systems
In-depth examinations of potential future developments and applications of spectroscopic ellipsometry

Perfect for master's- and PhD-level students in physics and chemistry, Introduction to Spectroscopic Ellipsometry of Thin Film Materials will also earn a place in the libraries of those studying materials science seeking a one-stop reference for the applications of spectroscopic ellipsometry to novel developed materials.

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Yes, you can access Introduction to Spectroscopic Ellipsometry of Thin Film Materials by Andrew T. S. Wee,Xinmao Yin,Chi Sin Tang in PDF and/or ePUB format, as well as other popular books in Technology & Engineering & Materials Science. We have over one million books available in our catalogue for you to explore.

Information

Publisher

Wiley-VCH

Year

2022

ISBN

9783527833955

Edition

Topic

Technology & Engineering

Subtopic

Materials Science

Index

Technology & Engineering

Cover
Table of Contents
Title Page
Copyright
Preface
1 Spectroscopic Ellipsometry: Basic Principles
2 Strongly Correlated Systems: Cuprates and Manganites
3 Two‐Dimensional Transition Metal Dichalcogenides
4 Single‐Layer Graphene Systems
5 Nickelate Systems
6 Future Development and Applications of Spectroscopic Ellipsometry
Index
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