X-ray Scattering From Semiconductors (2nd Edition)
eBook - PDF

X-ray Scattering From Semiconductors (2nd Edition)

  1. 316 pages
  2. English
  3. PDF
  4. Available on iOS & Android
eBook - PDF

X-ray Scattering From Semiconductors (2nd Edition)

Book details
Table of contents
Citations

About This Book

This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection.The description is intentionally conceptual so that the reader can grasp the real processes involved. In this way the analysis becomes significantly easier, making the reader aware of misleading artifacts and assisting in the determination of a more complete and reliable analysis. The theory of scattering is very important and is covered in such a way that the assumptions are clear. Greatest emphasis is placed on the dynamical diffraction theory including new developments extending its applicability to reciprocal space mapping and modelling samples with relaxed and distorted interfaces.A practical guide to the measurement of diffraction patterns, including the smearing effects introduced to the measurement, is also presented.

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Yes, you can access X-ray Scattering From Semiconductors (2nd Edition) by Paul F Fewster in PDF and/or ePUB format, as well as other popular books in Technologie et ingénierie & Science des matériaux. We have over one million books available in our catalogue for you to explore.

Information

Publisher
ICP
Year
2003
ISBN
9781860944581
Edition
2
Topic
Technologie et ingénierie
Subtopic
Science des matériaux

Table of contents

  1. Contents
  2. Preface
  3. Chapter 1 An Introduction to Semiconductor Materials
  4. Chapter 2 An Introduction to X-Ray Scattering
  5. Chapter 3 Equipment for Measuring Diffraction Patterns
  6. Chapter 4 A Practical Guide to the Evaluation of Structural Parameters
  7. Appendix 1 General Crystallographic Relations
  8. Subject Index